Intellectual Property Rights
PatentProgram CertificateProduct History
C-2020-008398
Copyright, Precise control using vision and servo motor
C-2019-012435
Copyright, Blemish detection for camera module
C-2018-003888
Copyright, Dicing device
C-2017-010633
Copyright, Detecting epoxy from dual camera module
C-2017-010634
Copyright, Test program for epoxy coating condition on camera module PCB
C-2017-010006
Copyright, Camera module function test
C-2017-010005
Copyright, Calculation algorithm for detecting pivot and gyration rate
C-2017-010004
Copyright, Camera module test SW development kit
C-2012-015571
Program, Smart lens aligning program
- 2023Golf Ball Inline System, CCM Bending/Bonding/Attach/Tester Dubbing, Right Angle, MST Loader, CPU Test Handler, Lens Dubbing, Folded zoom actuator system
- 2022SEM Wafer cleave system, SEM Wafer polishing system, EOL Tester, FOL Handler, Camera Module Actuator Tester, Memory Handler, Memory Peltier Handler
- 2021SEM Sample Preparation System Upgrade, TEC Block, Flying Vision, ToF Tester, Laser module Handler
- 2020Image sensor transfer system, CCM sorting system, CCM transfer system, Tray unloading system, Tray flipping system, SEM horizontal sample preparation system, Memory T2B transfer system
- 2019ToF test system, Universal P&P system, Tray packing inline system, PCB Folding& Unfolding system, SEM vertical sample preparation system, Memory test handler
- 2018Triple camera test system, Tray transfer system, Box packing inline system, Tape mounter
- 2017IR camera test system, Depth&color calibration system, Wafer laser marking system
- 2016Dual camera test system, PCB bending system, Actuator test system, PDAF system, PCB transfer system, Sheet particle remover, Dotting system, Wafer sorter
- 2015CCM Pick&Place system, PCB laser marking system, Auto wafer expander
- 2014VCM pre-focus system, Burn-in board test system, PR stripper, Reel tape inspector&sorter, RF module test handler
- 2013CCM test(Focus, image, DC) inline system, RF module test handler, Tray alignment inspector
- 2012Logic test system, Wafer sorter
- 2011OIS test system
- 2009Digital camera test system
- 20084port Linear type CCM test system
- 20072index semi-auto CCM test system
- 2006Semi-auto CCM test system(World's first)
- 2003Probe card test system