Memory

Semiconductor

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Memory Test Handler

Memory Test Handler 01
Memory Test Handler 02
Memory Test Handler 03
Memory Test Handler 04
Memory Test Handler 05
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SPECIFICATION
Function Memory Test Handler
Tray Type JEDEC Standard
Target device  BGA, CSP, TSOP, MCP, POP, etc.
Docking mode Horizontal docking
Parallel(Single test head) 4~32(R&D purpose)
Loading/unloading method Automatic P&P, 4 Pickers
Loading tray 10+10 trays
Tray stacker 2 loading, 1 empty, 1 good module, 1 bad module
Temperature range -40˚C to +150˚C
Control PC I7 Quad Core, 8G Byte Memory , Window 7 32bit
Dimension W1000 x D1600 x H2000mm (Inside)

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